STM Literature

6. Literature

K. Takayanagi et al. Structural analysis of Si(111)-7x7 by UHV-transmission electron diffraction and microscopy, J. Vacuum Sci. Technol. A 3, pp. 1502-1506 (1985)
R.J. Hamers et al. Surface Electronic Structure of Si(111)-7x7 Resolved in Real Space, Phys. Rev. Lett. 56, pp 1972-1975 (1986).
G. Binnig et al., 7x7 Reconstruction of Si(111) Resolved in Real Space, Phys. Rev. Lett. 50, pp 120-123 (1983).
U. Starke et al., Novel reconstruction mechanism for dangling-bond minimization: Combined method surface structure determination of SiC(111)-(3x3), Phys. Rev. Lett. 80, pp 758-761 (1998).

C.J. Chen, Introduction to Scanning Tunneling Microscopy, Oxford University Press, New York, 1993.
H.J.Güntherodt, R. Wiesendanger, Scanning Tunneling Microscopy I-III, Springer Verlag, Berlin, 1991.
J.A. Stroscio, W.J. Kaiser, Scanning Tunneling Microscopy, Academic Press, San Diego, 1993.
C. Bai, Scanning Tunneling Microscopy and its Application, Springer Verlag, Berlin, 1992.
R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy, Cambridge University Press, 1994